X-ray based measurement system (IPMS-MRS10.1) - PR1114595-2480-P

<div class="h1">Titel</div> <div class="pre">X-ray based measurement system (IPMS-MRS10.1) - PR1114595-2480-P</div> <div class="h1">Beschreibung</div> <div class="pre">1 Stück - Ultrasonic or X-Ray based measurement system Optionen: Option 1 - LV Pos. 16.2 - Contamination level for non-precious metals (" Al, Ti ≤ 50.0*E10 at/cm², all other metals ≤ 5.0*E10 at/cm²") Option 2 - LV Pos. 16.4 - Contamination level for noble metals (Ag, Au, Pd, Pt, Ru) (Confirmation of precious metal concentration < 0.05*E10 at/cm2 (< LOD)) Option 3 - LV Pos. 20.1 - Please offer to extend the warranty by a further 12 months to a total of 24 months. (Please specify as an option. If an extension of the warranty is offered, the full number of points will be awarded, otherwise 0 points will be awarded.) Option 4 - LV Pos. 20.2 - Please offer an Option to handle transparent substrates (like glas wafers) (Please specify as an option. If an option is offered, the full number of points will be awarded, otherwise 0 points will be awarded.)</div> <div class="h1">Interne Kennung</div> <div class="pre">LOT-0000</div>