Semiconductor test system (mixed-signal test system) SOC Test System - PR1025624 - 2270-W

<div class="h1">Titel</div> <div class="pre">Semiconductor test system (mixed-signal test system) SOC Test System - PR1025624 - 2270-W</div> <div class="h1">Beschreibung</div> <div class="pre">This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with additional lab equipment, i.e. precision SMUs, oscilloscopes and a manual or semi-automatic wafer prober. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.</div> <div class="h1">Interne Kennung</div> <div class="pre">LOT-0000</div>