Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P

<div class="h1">Titel</div> <div class="pre">Los 1: Precise ion beam based trenching tool (IMWS-03.2)</div> <div class="h1">Beschreibung</div> <div class="pre">Los 1: Precise ion beam based trenching tool (IMWS-03.2)</div> <div class="h1">Interne Kennung</div> <div class="pre">LOT-0001</div>